This application note demonstrates the capability of Omnian for the analysis of a variety of industry-related samples, using default settings in only three minutes per sample. Omnian's advanced fundamental parameters algorithm automatically deals with the analytical challenges posed by samples of widely different compositions from a variety of sources.
Developed for Malvern Panalytical's high-end x-ray fluorescence (XRF) spectrometers, Omnian is also available for the Epsilon energy dispersive x-ray fluorescence (EDXRF) benchtop systems.
This powerful combination brings together the strengths of Omnian with the ease-of-use of Epsilon 4. Omnian is designed to provide fast, reliable quantification in the default 'black box' mode. However, the data collected is comprehensive and can be reviewed in further detail if required.
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